Filter
Top Products
Intel® Solid-State Drive DC P3700 Series
Product Specification May 2015
16 330566-009US
2.6 Reliability Specifications
Intel SSD DC P3700 Series meets or exceeds SSD endurance and data retention requirements as specified in the
JESD218 standard. Reliability specifications are listed in the following table.
Table 15: Reliability Specifications
Parameter
Value
Uncorrectable Bit Error Rate (UBER)
Uncorrectable bit error rate will not exceed one sector in the
specified number of bits read. In the unlikely event of a non-
recoverable read error, the SSD will report it as a read failure to the
host; the sector in error is considered corrupt and is not returned to
the host.
< 1 sector per 10
17
bits read
Mean Time Between Failures (MTBF)
Mean Time Between Failures is estimated based on Telcordia*
methodology and demonstrated through Reliability Demonstration
Test (RDT).
2 million hours
Data Retention
The time period for retaining data in the NAND at maximum
rated endurance.
3 months power-off retention once SSD
reaches rated write endurance at 40° C
Endurance Rating
The number of drive writes such that the SSD meets the
requirements according to the JESD218 standard. Endurance rating
verification is defined to establish UBER <1E-16 at 60% upper
confidence limit.
400GB: 7.3 PBW
800GB: 14.6 PBW
(10 drive writes/day*)
1.6TB: 43.8 PBW
(15 drive writes/day*)
2.0TB: 62.05 PBW
(17 drive writes/day*)
Note: Petabytes Written (PBW). Refer to JESD218 standard table 1 for UBER, FFR and other Enterprise SSD
requirements.
2.7 Temperature Sensor
P3700 Series has an internal temperature sensor with an accuracy of +/-2° C over a range of -10° C to +85° C which
can be monitored using NVMe Health Log.
For more information on sensor reading see SMART attributes section. In addition, drive will provide out of band
access to temperature by means of SMBUS. The sensor has an accuracy of +/- 3° C over a range of -20° C to 125° C.
SMBUS temperature sensor will not be reported in NVMe Health Log.
2.8 Power Loss Capacitor Test
P3700 Series supports testing of the power loss capacitor, which can be monitored using SMART attribute critical
warning in log page identifier 02h, byte 0, bit 4.